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International Journal of Information Technology & Computer Science ( IJITCS )

Abstract :

 A register that goes through a sequence of distinct states upon the application of a sequence of input pulses is called a counter. Counters which count upward from zero to maximum are called binary counter. In this counter the ability of faults are available [1].  The characteristics of these types of faults render them undetectable by standard test strategies. The detection of intermittent faults requires the use of Concurrent Error Detection (CED) technique, which continuously monitors the operation of circuits and compares them with some known reference. This is achieved by incorporating some form of redundancy into the system [2]. One method of implementing CED in VLSI circuit is through the use of information redundancy. This paper investigates the use of information redundancy into unchecked system as a mean of incorporating CED into a self-checking binary counter .

Keywords :

: binary counter, Self checking, Concurrent Error Detection, Information Redundancy

References :

  1. M. Morris Mano and Charles R. Kime "Logic and Computer Design Fundamentals" by Prentice Hall, 3rd edition, chapter 7.p331.
  2. Russell, G.; Maamar, A.H., "Check bit prediction scheme using Dong's code for concurrent error detection in VLSI processors," Computers and Digital Techniques, IEE Proceedings - , vol.147, no.6, pp.467-471, Nov 2000.
  3. Miron Abramovici, Melvin A.Breuer, and Arthur D.Friedman, "Digital Systems Testing and Testable Design”,1990,ISBN 0-7803-1062-4, Chapter 13: SELF-CHECKING DESIGN, pp.569-587.
  4. Huda Abugharsa, and Ali Maamar," Self Checking Systolic LIFO Stack",7th WSEAS Int. Conf. on Instrumentation, Measurement, Circuits and Systems (IMCAS '08), Hangzhou, China, April 6-8,2008.
  5. M.MORRIS MANO, “Digital Design”, 2002, 1991, 1984 by Prentice Hall, Upper Saddle River, New Jersey 07458, Chapter 6, P234.
  6. Michael D.Ciletti, "Advanced Digital Design with the Verilog HDL", Upper Saddle River, New Jersey, Chapter 9, pp.628-641.

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